US 11,948,285 B2
Imaging systems with multiple radiation sources
Peiyan Cao, Shenzhen (CN); and Yurun Liu, Shenzhen (CN)
Assigned to SHENZHEN XPECTVISION TECHNOLOGY CO., LTD., Shenzhen (CN)
Filed by SHENZHEN XPECTVISION TECHNOLOGY CO., LTD., Shenzhen (CN)
Filed on Jul. 6, 2021, as Appl. No. 17/368,402.
Prior Publication US 2023/0010044 A1, Jan. 12, 2023
Int. Cl. G06K 9/00 (2022.01); G06T 3/4038 (2024.01); G06T 5/50 (2006.01)
CPC G06T 5/50 (2013.01) [G06T 3/4038 (2013.01); G06T 2207/10116 (2013.01); G06T 2207/20221 (2013.01)] 26 Claims
OG exemplary drawing
 
1. A method, comprising:
for i=1, . . . , M, and j=1, . . . , Ni, sending beam groups (i, j) toward a same object and then toward a same image sensor;
for each value of i and each value of j, capturing with the image sensor a partial image (i, j) of the object using radiation of a beam group (i, j) that has transmitted through the object;
for each value of i, stitching the partial images (i, j), j=1, Ni resulting in a stitched image (i) of the object; and
reconstructing a three-dimensional image of the object based on the stitched images (i), i=1, M,
wherein the beam groups (i, j), i=1, M, and j=1, Ni are sent one beam group at a time,
wherein the image sensor comprises P active areas,
wherein for each value of i and each value of j, the beam group (i, j) comprises P radiation beams sent simultaneously and aimed respectively at the P active areas,
wherein M and Ni, i=1, M are integers greater than 1,
wherein P is a positive integer and P >1,
wherein the beam groups (i, j), i=1, M, and j=1, Ni are sent from a mask,
wherein for each value of i, the beam groups (i, Ni are sent from a window group (i) of the mask,
wherein for each value of i, the window group (i) comprises P windows,
wherein for each value of i and each value of j, the P radiation beams of the beam group (i, j) are sent from respectively the P windows of the window group (i),
wherein at least a pair of q and r are of 1, . . . , M,
wherein q≠r,
wherein at least a pair of s and t are of 1, . . . , Nq and 1, Nr respectively,
wherein a position of the mask when the partial image (q, s) is captured and a position of the mask when the partial image (r, t) is captured are the same,
wherein a position of the image sensor when the partial image (q, s) is captured and a position of the image sensor when the partial image (r, t) is captured are the same, and
wherein q, s, r, t, Nq and Nr are each a positive integer.