US 11,947,059 B2
Semiconductor x-ray detector
Peiyan Cao, Shenzhen (CN); and Yurun Liu, Shenzhen (CN)
Assigned to SHENZHEN XPECTVISION TECHNOLOGY CO., LTD., Shenzhen (CN)
Filed by SHENZHEN XPECTVISION TECHNOLOGY CO., LTD., Shenzhen (CN)
Filed on Apr. 28, 2023, as Appl. No. 18/309,010.
Application 18/309,010 is a continuation of application No. 17/471,785, filed on Sep. 10, 2021, granted, now 11,675,095.
Application 17/471,785 is a continuation of application No. PCT/CN2019/080407, filed on Mar. 29, 2019.
Prior Publication US 2023/0258831 A1, Aug. 17, 2023
Int. Cl. G01T 1/24 (2006.01)
CPC G01T 1/246 (2013.01) [G01T 1/241 (2013.01)] 17 Claims
OG exemplary drawing
 
1. An apparatus suitable for detecting X-ray, comprising:
an X-ray absorption layer comprising an electrode;
an electronics layer comprising:
a first voltage comparator configured to compare a voltage of the electrode to a first threshold;
a second voltage comparator configured to compare the voltage to a second threshold;
a counter configured to register a number of X-ray photons absorbed by the X-ray absorption layer;
a controller;
wherein the controller is configured to start a time delay from a time at which the first voltage comparator determines that an absolute value of the voltage equals or exceeds an absolute value of the first threshold;
wherein the controller is configured to activate the second voltage comparator during the time delay;
wherein the controller is configured to cause the number registered by the counter to increase by one, if the second voltage comparator determines that an absolute value of the voltage equals or exceeds an absolute value of the second threshold; and
a wall in a space among electrical connections between the X-ray absorption layer and the electronics layer;
wherein the space has a non-uniform filling with a filler material.