US 11,946,912 B2
System and method of trace-level analysis of chemical compounds
Daniel B. Cardin, Simi Valley, CA (US)
Assigned to Entech Instruments Inc., Simi Valley, CA (US)
Filed by Entech Instruments Inc., Simi Valley, CA (US)
Filed on Jun. 30, 2021, as Appl. No. 17/364,517.
Claims priority of provisional application 63/046,454, filed on Jun. 30, 2020.
Prior Publication US 2021/0404995 A1, Dec. 30, 2021
Int. Cl. G01N 30/14 (2006.01); G01N 30/12 (2006.01); G01N 30/02 (2006.01)
CPC G01N 30/12 (2013.01) [G01N 30/14 (2013.01); G01N 2030/025 (2013.01); G01N 2030/128 (2013.01); G01N 2030/143 (2013.01)] 14 Claims
OG exemplary drawing
 
1. A system comprising:
a first oven containing an SVOC focuser and an analytical column;
a thermal desorber fluidly coupled to the SVOC focuser and analytical column;
a VOC focuser fluidly coupled to the SVOC focuser;
a plurality of valves configured to:
introduce a first flow of sample from a sample extraction device contained in the thermal desorber to the SVOC focuser, through the SVOC focuser towards the VOC focuser, wherein the SVOC focuser is configured to retain first compounds and the VOC focuser is configured to retain second compounds;
after the SVOC focuser retains the first compounds and the VOC focuser retains second compounds, introduce a second flow of the sample from the VOC focuser and the SVOC focuser to the analytical column, wherein the second flow transfers the first compounds and second compounds to the analytical column; and
an analyzer fluidly coupled to the analytical column, wherein the analyzer is configured to conduct a chemical analysis of the first and second compounds after the first and second compounds traverse the analytical column.