US 11,946,849 B2
Fast and robust Fourier domain-based cell differentiation
Bruno Cornelis, Brussels (BE); David Blinder, Antwerp (BE); Peter Schelkens, Willebroek (BE); and Bart Jansen, Mechelen (BE)
Assigned to IMEC VZW, Leuven (BE); and Vrije Universiteit Brussel, Brussels (BE)
Appl. No. 16/957,005
Filed by IMEC VZW, Leuven (BE); and Vrije Universiteit Brussel, Brussels (BE)
PCT Filed Dec. 24, 2018, PCT No. PCT/EP2018/086837
§ 371(c)(1), (2) Date Jun. 22, 2020,
PCT Pub. No. WO2019/122452, PCT Pub. Date Jun. 27, 2019.
Claims priority of application No. 17210427 (EP), filed on Dec. 22, 2017.
Prior Publication US 2020/0340908 A1, Oct. 29, 2020
Int. Cl. G01N 15/1434 (2024.01); G01N 15/01 (2024.01); G01N 15/10 (2006.01); G01N 15/14 (2006.01); G01N 15/1433 (2024.01); G01N 15/149 (2024.01); G03H 1/00 (2006.01); G03H 1/04 (2006.01)
CPC G01N 15/1434 (2013.01) [G01N 15/1433 (2024.01); G01N 15/147 (2013.01); G03H 1/0005 (2013.01); G03H 1/0443 (2013.01); G01N 2015/016 (2024.01); G01N 2015/1006 (2013.01); G01N 2015/1454 (2013.01); G01N 15/149 (2024.01); G03H 2001/005 (2013.01); G03H 2001/0447 (2013.01); G03H 2001/045 (2013.01); G03H 2001/0452 (2013.01)] 16 Claims
OG exemplary drawing
 
1. A differentiation system for differentiating microscopic particles, the system comprising:
an input device configured to receive an interference pattern representative of a microscopic particle in suspension, the interference pattern corresponding to holographic images acquired with a digital in-line holographic microscope from the microscopic particle in suspension, wherein the digital in-line holographic microscope is configured to capture depth information during acquisition of the interference pattern;
holographic image data processing logic configured to derive a Fourier spectrum of the interference pattern by performing a Fourier transform; and
a microscopic particle recognizer configured to determine characterization features from the Fourier spectrum of the interference pattern for characterization of the microscopic particle, wherein the characterization features include rotationally invariant features.