CPC H10D 1/472 (2025.01) [H01L 21/02052 (2013.01); H01L 21/02178 (2013.01); H01L 21/02266 (2013.01); H01L 21/0228 (2013.01)] | 4 Claims |
1. A high-resistance resistor based on silicon carbide, comprising:
a semi-insulating 4H—SiC silicon carbide substrate; wherein a silicon surface and a carbon surface of the semi-insulating 4H—SiC silicon carbide substrate are provided with aluminum oxide insulating layers, wherein the aluminum oxide insulating layers are symmetrical and atomic-thickness; thicknesses of the aluminum oxide insulating layers are 0.2 nm-2 nm; conductive metal electrodes are formed at two sides of the aluminum oxide insulating layers through evaporation; and thicknesses of the conductive metal electrodes are 100 nm-500 nm.
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