US 12,267,069 B1
Single-event effect tolerant register
David A. Grant, Dallas, TX (US); and Noah C. Parker, Plano, TX (US)
Assigned to Apogee Semiconductor, Inc., Plano, TX (US)
Filed by Apogee Semiconductor, Inc., Plano, TX (US)
Filed on Oct. 22, 2024, as Appl. No. 18/923,166.
Int. Cl. H03K 19/003 (2006.01); H03K 19/23 (2006.01)
CPC H03K 19/00369 (2013.01) [H03K 19/23 (2013.01)] 24 Claims
OG exemplary drawing
 
1. A resilient majority driver accepting triple-redundant input signals, comprising:
a first stage, comprising
a first digital majority voter having inputs connected to the input signals and generating a first majority output,
a second digital majority voter having inputs connected to the input signals and generating a second majority output, and
a third digital majority voter having inputs connected to the input signals and generating a third majority output; and
a second stage, comprising
a first Muller C-element comprising a voter segment having two inputs connected respectively to the first majority output and the second majority output,
a second Muller C-element comprising a voter segment having two inputs connected respectively to the second majority output and the third majority output, and
a third Muller C-element comprising a voter segment having two inputs connected respectively to the first majority output and the third majority output,
each Muller C-element generating a Muller C-element output that reflects agreement of the two inputs and retains its state when the two inputs disagree transiently or a single-event transient occurs at an internal node, the Muller C-element outputs connected together at a summing node to produce a signal at a driver output resulting from an analog majority vote of the first, second, and third majority outputs,
whereby the signal at the driver output is resilient to static single errors at the triple-redundant input signals and to transient errors due to single-event transients at any node in the resilient majority driver.