US 12,266,957 B2
Protection circuit for secondary battery and abnormality detection system of secondary battery
Toshiyuki Isa, Kanagawa (JP); Takayuki Ikeda, Kanagawa (JP); Kei Takahashi, Kanagawa (JP); and Ryota Tajima, Kanagawa (JP)
Assigned to Semiconductor Energy Laboratory Co., Ltd., Atsugi (JP)
Appl. No. 17/431,302
Filed by SEMICONDUCTOR ENERGY LABORATORY CO., LTD., Atsugi (JP)
PCT Filed Feb. 11, 2020, PCT No. PCT/IB2020/051042
§ 371(c)(1), (2) Date Aug. 16, 2021,
PCT Pub. No. WO2020/174299, PCT Pub. Date Sep. 3, 2020.
Claims priority of application No. 2019-031868 (JP), filed on Feb. 25, 2019; and application No. 2019-070562 (JP), filed on Apr. 2, 2019.
Prior Publication US 2022/0131392 A1, Apr. 28, 2022
Int. Cl. H02J 7/00 (2006.01); G01R 31/367 (2019.01); G01R 31/382 (2019.01); H01L 27/02 (2006.01); H01M 10/48 (2006.01)
CPC H02J 7/0031 (2013.01) [G01R 31/367 (2019.01); H01L 27/0266 (2013.01); H01M 10/48 (2013.01); G01R 31/382 (2019.01)] 6 Claims
OG exemplary drawing
 
1. An abnormality detection system comprising:
a secondary battery;
a first module electrically connected to the secondary battery;
a detection unit electrically connected to the first module;
a first disconnecting switch electrically connected to the first module;
a second module electrically connected to the secondary battery;
a second disconnecting switch electrically connected to the second module; and
a neural network portion configured to estimate at least one of deterioration state of the secondary battery and charge state of the secondary battery,
wherein the abnormality detection system is configured to turn off the first disconnecting switch when the first module detects an abnormality,
wherein the abnormality detection system is configured to turn off the second disconnecting switch when the second module detects an abnormality,
wherein the first module includes a transistor comprising an oxide semiconductor,
wherein the first module is configured to detect the abnormality by comparing estimated value and measurement value,
wherein the estimated value is calculated by electric circuit model using plurality of parameters, and
wherein the measurement value is measured by the detection unit.