US 12,266,671 B2
Photodetectors with a deep trench isolation region that includes a bragg mirror
Eric Linardy, Singapore (SG); Eng Huat Toh, Singapore (SG); Ping Zheng, Singapore (SG); and Kiok Boone Elgin Quek, Singapore (SG)
Assigned to GlobalFoundries Singapore Pte. Ltd., Singapore (SG)
Filed by GLOBALFOUNDRIES Singapore Pte. Ltd., Singapore (SG)
Filed on Oct. 21, 2021, as Appl. No. 17/507,213.
Prior Publication US 2023/0131505 A1, Apr. 27, 2023
Int. Cl. H01L 27/146 (2006.01); H10F 39/00 (2025.01); H10F 39/18 (2025.01)
CPC H10F 39/8067 (2025.01) [H10F 39/011 (2025.01); H10F 39/024 (2025.01); H10F 39/18 (2025.01); H10F 39/8063 (2025.01); H10F 39/807 (2025.01)] 20 Claims
OG exemplary drawing
 
1. A structure for a photodetector, the structure comprising:
a first semiconductor layer including a p-n junction;
a second semiconductor layer having an interface with the first semiconductor layer; and
a deep trench isolation region in a trench with a plurality of sidewalls extending fully through the first semiconductor layer and the second semiconductor layer, the deep trench isolation region including a first plurality of layers and a second plurality of layers positioned in the trench, the second plurality of layers alternating with the first plurality of layers to define a Bragg mirror, the first plurality of layers comprising a first material having a first refractive index, and the second plurality of layers comprising a second material having a second refractive index that is greater than the first refractive index,
wherein each of the first plurality of layers includes a first portion extending down the plurality of sidewalls of the trench and a second portion extending across the trench to provide a first U-shape, and each of the second plurality of layers includes a first portion extending down the plurality of sidewalls of the trench and a second portion extending across the trench to provide a second U-shape.