| CPC H01L 23/13 (2013.01) [H01L 23/3121 (2013.01); H01L 23/49822 (2013.01); H01L 25/0652 (2013.01); H01L 2225/06506 (2013.01); H01L 2225/0651 (2013.01); H01L 2225/06548 (2013.01); H01L 2225/06562 (2013.01)] | 19 Claims |

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1. A semiconductor device, comprising:
a substrate comprising:
a first section comprising contact fingers configured to electrically couple the semiconductor device to a connector of a host device, the first section having a first thickness, and
a second section having a second thickness thinner than the first thickness;
one or more semiconductor dies mounted on the second section of the substrate and electrically coupled to the contact fingers in the first section of the substrate; and
mold compound encapsulating the one or more semiconductor dies on the second section, the mold compound leaving the contact fingers uncovered and exposed;
wherein the substrate comprises a first flat planar surface and a second surface, opposed to the first surface, comprising differential heights of the first and second sections.
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