US 12,266,416 B2
Test board
Huipeng Yang, Hefei (CN)
Assigned to CHANGXIN MEMORY TECHNOLOGIES, INC., Hefei (CN)
Filed by CHANGXIN MEMORY TECHNOLOGIES, INC., Hefei (CN)
Filed on Nov. 22, 2021, as Appl. No. 17/456,079.
Application 17/456,079 is a continuation of application No. PCT/CN2021/112452, filed on Aug. 13, 2021.
Claims priority of application No. 202110097232.3 (CN), filed on Jan. 25, 2021.
Prior Publication US 2022/0238176 A1, Jul. 28, 2022
Int. Cl. G11C 29/56 (2006.01); G11C 29/50 (2006.01)
CPC G11C 29/56016 (2013.01) [G11C 29/50 (2013.01); G11C 2029/5006 (2013.01)] 16 Claims
OG exemplary drawing
 
1. A test board, which is applied in temperature and humidity tests for a memory module and comprises:
a memory slot configured to be connected with the memory module;
a power supply terminal configured to supply power to the memory module;
an overcurrent protection unit connected in series between the memory slot and the power supply terminal and configured to be blown when the memory module is short-circuited; and
an indicating unit connected in series between the overcurrent protection unit and a ground terminal and configured to indicate a state of the overcurrent protection unit;
wherein the power supply terminal is configured to at least provide a first voltage and a second voltage, the second voltage is greater than the first voltage, the first voltage is used to supply power to a first pin of the memory module through a first protection unit of the overcurrent protection unit, and the second voltage is used to supply power to a second pin of the memory module through a second protection unit of the overcurrent protection unit.