US 12,266,314 B2
Display device and electronic apparatus
Takuma Fujii, Kanagawa (JP); and Naobumi Toyomura, Kanagawa (JP)
Assigned to Sony Semiconductor Solutions Corporation, Kanagawa (JP)
Filed by Sony Semiconductor Solutions Corporation, Kanagawa (JP)
Filed on Apr. 11, 2024, as Appl. No. 18/633,194.
Application 18/633,194 is a continuation of application No. 18/323,062, filed on May 24, 2023, granted, now 11,978,405.
Application 18/323,062 is a continuation of application No. 17/871,204, filed on Jul. 22, 2022, granted, now 11,705,072, issued on Jul. 18, 2023.
Application 17/871,204 is a continuation of application No. 17/067,163, filed on Oct. 9, 2020, granted, now 11,430,389, issued on Aug. 30, 2022.
Application 17/067,163 is a continuation of application No. 16/323,616, granted, now 10,839,752, issued on Nov. 17, 2020, previously published as PCT/JP2017/027160, filed on Jul. 27, 2017.
Claims priority of application No. 2016-184280 (JP), filed on Sep. 21, 2016.
Prior Publication US 2024/0347009 A1, Oct. 17, 2024
Int. Cl. H10K 50/125 (2023.01); G09G 3/3266 (2016.01); H10K 59/121 (2023.01); H10K 59/131 (2023.01); G09G 3/3233 (2016.01)
CPC G09G 3/3266 (2013.01) [H10K 50/125 (2023.02); H10K 59/1213 (2023.02); H10K 59/1216 (2023.02); H10K 59/131 (2023.02); G09G 3/3233 (2013.01); G09G 2300/0426 (2013.01); G09G 2320/0233 (2013.01)] 5 Claims
OG exemplary drawing
 
1. A display device comprising:
a substrate;
a plurality of pixel circuits, each of the pixel circuits including a sampling transistor, a driving transistor, a first switching transistor, a capacitive element and a light emitting element;
a plurality of scanning lines including a first scanning line, a second scanning line and a third scanning line, the first scanning line being connected to a control terminal of the sampling transistor, and the second scanning line being connected to a control terminal of the first switching transistor; and
a plurality of signal lines including a first signal line, the first signal line being connected to a first terminal of the sampling transistor, wherein
the sampling transistor is electrically connected between the first signal line and a control terminal of the driving transistor,
a first terminal of the driving transistor is electrically connected to a first terminal of the first switching transistor,
the first terminal of the driving transistor is electrically connected to an anode electrode of the light emitting element,
the first scanning line and the second scanning line are disposed in a first interconnection layer,
the first signal line and a first electrode of the capacitive element are disposed in a second interconnection layer,
the first interconnection layer is disposed between the substrate and the second interconnection layer,
the first scanning line and the second scanning line extend in a first direction, and
the first signal line extends in a second direction perpendicular to the first direction.