| CPC G01R 27/2688 (2013.01) | 6 Claims |

|
1. A device for measuring a microwave surface resistance of a dielectric conductor deposition interface, comprising: a test platform, a calibration component, a sealing cavity and a support plate;
wherein the test platform comprises: a shielding cavity having an open bottom, a dielectric rod, an input coupling structure, an output coupling structure, and a dielectric supporter; wherein the input coupling structure and the output coupling structure are symmetrically distributed on two sides of the shielding cavity; the dielectric rod is located inside the shielding cavity, and is fixed to the shielding cavity by the dielectric supporter; a bottom end of the dielectric rod and a bottom end of the shielding cavity are on a same plane;
wherein a dielectric conductor test sample is placed on the bottom end of the dielectric rod and a bottom concave of the shielding cavity, and is detachably fastened by the support plate to form a TE0m(n+δ) (m, n=1, 2, 3 . . . ) mode dielectric resonator with the test platform; wherein the dielectric conductor test sample is obtained by depositing a conductor on a dielectric; a dielectric side of the dielectric conductor test sample faces an interior of the dielectric resonator, and a conductor side is attached to the support plate;
wherein the calibration component is detachably arranged on the bottom end of the shielding cavity; and
wherein the sealing cavity is detachably arranged on an extension part of the bottom end of the shielding cavity.
|