| CPC G01N 27/127 (2013.01) [C23C 26/00 (2013.01); H01L 21/02628 (2013.01); H01L 29/0676 (2013.01); H01L 29/267 (2013.01)] | 20 Claims |

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1. A heterostructure semiconductor for sensing a gas, the heterostructure semiconductor comprising:
a substrate made of nanosheets of a compound of a first metal, wherein the compound of the first metal is sensitive to the gas to be sensed;
one or more 1-Dimensional (1D) components fabricated on a surface of the substrate, the 1D components comprising a compound of a second metal, wherein the compound of the second metal is selective to the gas to be sensed; and
a 2-Dimensional (2D) layer formed on the surface of the substrate in portions excluding the 1D components, wherein the 2D layer comprises compounds of the first and second metal.
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12. A method for fabrication of a heterostructure semiconductor for sensing a gas, the method comprising:
obtaining a substrate, wherein the substrate is made of nanosheets of a compound of a first metal, wherein the compound of the first metal is sensitive to the gas to be sensed;
obtaining a solution of a precursor of 1D components to be formed on the substrate, wherein the 1D components are made of a compound of a second metal, wherein the compound of the second metal is selective to the gas to be sensed;
contacting the solution of the precursor of the 1D component with the substrate to obtain a first mixture; and
irradiating the first mixture with microwaves to form the heterostructure comprising one or more of the 1-Dimensional (1D) components fabricated on a surface of the substrate and a 2-Dimensional (2D) layer formed on the surface of the substrate in portions excluding the one or more of the 1-Dimensional (1D) components, wherein the 2D layer comprises compounds of the first and second metal.
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