US 12,265,022 B2
THz measuring device and THz measurement method for measuring test objects, in particular pipes
Ralph Klose, Melle (DE); and Jörg Klever, Halle (DE)
Assigned to CiTEX Holding GmbH, Melle (DE)
Appl. No. 18/024,651
Filed by CiTEX Holding GmbH, Melle (DE)
PCT Filed Sep. 15, 2021, PCT No. PCT/DE2021/100761
§ 371(c)(1), (2) Date Mar. 3, 2023,
PCT Pub. No. WO2022/057980, PCT Pub. Date Mar. 24, 2022.
Claims priority of application No. 102020123992.0 (DE), filed on Sep. 15, 2020.
Prior Publication US 2023/0314315 A1, Oct. 5, 2023
Int. Cl. G01N 21/35 (2014.01); G01B 11/06 (2006.01); G01N 21/3563 (2014.01); G01N 21/3581 (2014.01)
CPC G01N 21/3563 (2013.01) [G01B 11/06 (2013.01); G01N 21/3581 (2013.01)] 17 Claims
OG exemplary drawing
 
1. A THz measuring device for measuring a test object, in particular a pipe, the THz measuring device comprising:
a first THz transceiver designed to output a first THz beam with a first polarization plane along an optical axis in a first direction through a measuring chamber of the measuring device,
a second THz transceiver designed to emit a second THz beam, polarized in a second polarization plane different from the first polarization plane, along the optical axis, a first polarization mirror designed to reflect the first THz beam, which has travelled through the measuring chamber along the optical axis, back to the first THz transceiver, and to allow the second THz beam to pass, at least in part,
a second polarization mirror designed to reflect the second THz beam, which has travelled through the measuring chamber, along the optical axis back to the second transceiver, and to allow the first THz beam to pass, at least in part,
an evaluation unit designed to receive a first measuring signal of the first THz transceiver and a second measuring signal of the second THz transceiver, determine first measuring peaks of the first measuring signal and second measuring peaks of the second measuring signal and layer thicknesses and/or a refractive index of the tested object.