US 12,265,008 B2
Particle measuring device
Kaoru Kondo, Kokubunji (JP); Kazuna Bando, Kokubunji (JP); Takuya Tabuchi, Kokubunji (JP); and Sota Kondo, Kokubunji (JP)
Assigned to RION CO., LTD., Kokubunji (JP)
Appl. No. 17/642,940
Filed by RION CO., LTD., Kokubunji (JP)
PCT Filed Dec. 17, 2020, PCT No. PCT/JP2020/047150
§ 371(c)(1), (2) Date Mar. 14, 2022,
PCT Pub. No. WO2021/132017, PCT Pub. Date Jul. 1, 2021.
Claims priority of application No. 2019-237757 (JP), filed on Dec. 27, 2019.
Prior Publication US 2022/0364971 A1, Nov. 17, 2022
Int. Cl. G01N 15/0227 (2024.01); G01N 21/05 (2006.01); G01N 21/01 (2006.01)
CPC G01N 15/0227 (2013.01) [G01N 21/05 (2013.01); G01N 2021/0112 (2013.01); G01N 2021/052 (2013.01)] 11 Claims
OG exemplary drawing
 
1. A particle measuring device, comprising:
a diffractive optical element configured to shape light for irradiating a particle into a flat top beam, where a cross section of the flat top beam at a focal position has a substantially oblong-and-sheet shape;
a flow cell configured to form a flow passage for a sample therein;
a light source configured to emit irradiation light;
a photodetector element located opposed to a flow direction of the sample and at a position obtained by extending a prescribed section of the flow passage in the flow direction of the sample,
wherein the photodetector element detects light scattered from a particle included in the sample, where the particle passes a detection region formed in the prescribed section of the flow passage by irradiating with the irradiation light;
a processor configured to obtain a particle size of the particle with analyzing on a basis of the scattered light, in which the diffractive optical element shapes the irradiation light and irradiates the sample flowing through the prescribed section with shaped irradiation light; and
a slit configured to separate a principal light beam from high-order diffraction light generated in a process that the diffractive optical element shapes the irradiation light.