US 12,264,978 B2
Device and arrangement for measuring load on a test object, in particular a chassis component
Christoph Schanz, Frickenhausen (DE); Philipp Cörlin, Unterensingen (DE); and Philippe Klemm, Unterensingen (DE)
Assigned to Trafag AG, Bubikon (CH)
Appl. No. 17/601,239
Filed by Trafag AG, Bubikon (CH)
PCT Filed Mar. 17, 2020, PCT No. PCT/EP2020/057337
§ 371(c)(1), (2) Date Oct. 4, 2021,
PCT Pub. No. WO2020/200775, PCT Pub. Date Oct. 8, 2020.
Claims priority of application No. 10 2019 108 898.4 (DE), filed on Apr. 4, 2019.
Prior Publication US 2022/0170802 A1, Jun. 2, 2022
Int. Cl. G01L 1/12 (2006.01); G01L 1/26 (2006.01); G01M 17/007 (2006.01)
CPC G01L 1/127 (2013.01) [G01L 1/26 (2013.01); G01M 17/007 (2013.01)] 14 Claims
OG exemplary drawing
 
1. A load measurement device (12) for measuring a load in a test object (14), comprising:
a sensor head;
a magnetic field generating device (18) for generating a magnetic field in the test object (14), the magnetic field generating device (18) comprising a magnetic field generating coil (Lg) arranged on the sensor head and a current source for supplying the magnetic field generating coil (Lg) with a periodically alternating current;
a first magnetic field detecting device (20) for detecting a first magnetic field parameter which changes on the basis of a load in the test object (14) and for generating a first magnetic field parameter signal which changes periodically on the basis of the periodically generated magnetic field, said first magnetic field detecting device (20) comprising at least one first magnetic field sensor (26-1) arranged on the sensor head (10);
a second magnetic field detecting device (22) for detecting a second magnetic field parameter which changes on the basis of a load in the test object (14) and for generating a second magnetic field parameter signal which changes periodically on the basis of the periodically generated magnetic field, said second magnetic field detecting device (22) comprising at least one second magnetic field sensor (26-2) arranged on the sensor head (10);
an evaluation device (42) for generating a measurement signal from the first and the second magnetic field parameter signal; and
a measurement environment parameter acquisition device (80) for acquiring at least one measurement environment parameter in the test object (14),
said evaluation device (42) being configured to generate the measurement signal corrected based on said at least one measurement environment parameter acquired by the measurement environment parameter acquisition device (80),
characterized in that the measurement environment parameter acquisition device (80) comprises:
an acceleration sensor (82) for detecting an acceleration applied to the sensor head (10) and/or to the test object (14).