US 12,264,941 B2
Magnetic sensor device, method of manufacturing the sensor device, and rotational operation mechanism
Shinichirou Mochizuki, Tokyo (JP)
Assigned to TDK Corporation, Tokyo (JP)
Filed by TDK Corporation, Tokyo (JP)
Filed on Mar. 27, 2024, as Appl. No. 18/618,569.
Application 18/618,569 is a continuation of application No. 18/119,475, filed on Mar. 9, 2023, abandoned.
Application 18/119,475 is a continuation of application No. 17/128,018, filed on Dec. 19, 2020, granted, now 11,635,296, issued on Apr. 25, 2023.
Claims priority of application No. 2020-049897 (JP), filed on Mar. 19, 2020.
Prior Publication US 2024/0247932 A1, Jul. 25, 2024
This patent is subject to a terminal disclaimer.
Int. Cl. G01C 9/06 (2006.01); G01R 33/00 (2006.01); G01R 33/02 (2006.01); G01R 33/09 (2006.01)
CPC G01C 9/06 (2013.01) [G01R 33/0029 (2013.01); G01R 33/0052 (2013.01); G01R 33/0206 (2013.01); G01R 33/09 (2013.01)] 14 Claims
OG exemplary drawing
 
1. A magnetic sensor device comprising:
a first surface, and a first inclined surface and a second inclined surface, which are inclined with respect to the first surface;
a first magnetic sensor unit;
a second magnetic sensor unit; and
a signal processing unit configured to perform signal processing on the basis of a first sensor signal S1 output from the first magnetic sensor unit and a second sensor signal S2 output from the second magnetic sensor unit,
wherein the first magnetic sensor unit is provided on the first inclined surface;
the second magnetic sensor unit is provided on the second inclined surface; and
the signal processing unit includes a corrected signal generation unit configured to generate a first corrected signal SC1 and a second corrected signal SC2, which are signals generated by correcting the first sensor signal Sand the second sensor signal S2 in accordance with an inclination angle θ1 of the first inclined surface and an inclination angle θ2 of the second inclined surface.