US 12,264,466 B2
Dynamically re-configurable in-field self-test capability for automotive systems
Kiran Kumar Malipeddi, San Diego, CA (US); and Rahul Gulati, San Diego, CA (US)
Assigned to QUALCOMM Incorporated, San Diego, CA (US)
Filed by QUALCOMM Incorporated, San Diego, CA (US)
Filed on Mar. 9, 2023, as Appl. No. 18/181,035.
Application 18/181,035 is a division of application No. 17/161,731, filed on Jan. 29, 2021, granted, now 11,634,895.
Prior Publication US 2023/0203796 A1, Jun. 29, 2023
Int. Cl. E03C 1/046 (2006.01)
CPC E03C 1/0465 (2013.01) 8 Claims
OG exemplary drawing
 
1. A method of in-field testing electronic components included in a vehicle, comprising:
receiving, in a dedicated local supervisor safety manager component of a primary boot processor, a list of subsystems that are associated with a safety critical automotive application of the vehicle;
determining, by the dedicated local supervisor safety manager component for each subsystem in the list of subsystems, whether verification of compliance with a safety requirement requires that the subsystem be tested at power-on (PON), at power-off (POFF), or during runtime;
dynamically determining, by the dedicated local supervisor safety manager component for each subsystem in the list of subsystems, a coverage level required for performing a built in self test (BIST) on that subsystem; and
performing BISTs on the subsystems at the determined coverage level; and
transmitting, by the dedicated local supervisor safety manager component for each subsystem in the list of subsystems, a safety indication output to a global supervisor safety manager component based on the BISTs performed on the subsystems at the determined coverage level, wherein the safety indication output includes an error output, a fault output, an interrupt output, or any combination thereof.