US 11,942,314 B2
Mass spectrometer and mass spectrometry method
Yusuke Tagawa, Kyoto (JP); and Yuki Ishikawa, Kyoto (JP)
Assigned to SHIMADZU CORPORATION, Kyoto (JP)
Appl. No. 17/605,410
Filed by SHIMADZU CORPORATION, Kyoto (JP)
PCT Filed Jun. 6, 2019, PCT No. PCT/JP2019/022464
§ 371(c)(1), (2) Date Oct. 21, 2021,
PCT Pub. No. WO2020/245964, PCT Pub. Date Dec. 10, 2020.
Prior Publication US 2022/0216042 A1, Jul. 7, 2022
Int. Cl. H01J 49/00 (2006.01); H01J 49/04 (2006.01)
CPC H01J 49/0036 (2013.01) [H01J 49/0468 (2013.01)] 8 Claims
OG exemplary drawing
 
1. A mass spectrometer including an ionization unit, a mass separation unit, and a detection unit, the mass spectrometer comprising:
a first measurement control unit configured to control the ionization unit, the mass separation unit, and the detection unit so as to repeatedly execute a first measurement on a target sample while changing values of a plurality of parameters defined as device parameters;
a second measurement control unit configured to control the ionization unit, the mass separation unit, and the detection unit so as to set a value of each of the plurality of parameters to a predetermined reference value and execute a second measurement on the target sample at not less than two time points before, after, or in a middle of repetition of the first measurement;
a correction processing unit configured to correct results of the first measurements by using results of the second measurements executed at not less than two time points; and
a device parameter-related information acquisition unit configured to determine the plurality of parameters using the measurement results corrected by the correction processing unit or acquire reference information for determining the plurality of parameters.