US 11,941,795 B2
Surface inspection apparatus, non-transitory computer readable medium storing program, and surface inspection method
Takashi Hiramatsu, Kanagawa (JP); Kaito Tasaki, Kanagawa (JP); Kiyofumi Aikawa, Kanagawa (JP); Miho Uno, Kanagawa (JP); Hirokazu Ichikawa, Kanagawa (JP); and Yoshitaka Kuwada, Kanagawa (JP)
Assigned to FUJIFILM Business Innovation Corp., Tokyo (JP)
Filed by FUJIFILM Business Innovation Corp., Tokyo (JP)
Filed on Nov. 3, 2021, as Appl. No. 17/517,670.
Claims priority of application No. 2021-095767 (JP), filed on Jun. 8, 2021.
Prior Publication US 2022/0392050 A1, Dec. 8, 2022
Int. Cl. G06T 7/40 (2017.01); G06T 7/00 (2017.01); G06T 11/60 (2006.01)
CPC G06T 7/0004 (2013.01) [G06T 7/40 (2013.01); G06T 11/60 (2013.01); G06T 2207/30164 (2013.01)] 16 Claims
OG exemplary drawing
 
1. A surface inspection apparatus comprising:
an imaging device configured to image a surface of an object to be inspected; and
a processor configured to:
calculate a numerical value representing a quality of the surface by processing an image captured by the imaging device; and
receive a change in a range used to calculate the numerical value indicated by an index in the image,
display, in the image, a first index indicating the range before receiving the change and a second index indicating the range after receiving the change,
wherein the first index is displayed even during the change of the range.