US 11,940,889 B2
Combined TDECQ measurement and transmitter tuning using machine learning
John J. Pickerd, Hillsboro, OR (US); and Kan Tan, Portland, OR (US)
Assigned to Tektronix, Inc., Beaverton, OR (US)
Filed by Tektronix, Inc., Beaverton, OR (US)
Filed on Jul. 29, 2022, as Appl. No. 17/877,829.
Claims priority of provisional application 63/232,378, filed on Aug. 12, 2021.
Prior Publication US 2023/0050303 A1, Feb. 16, 2023
Int. Cl. G06F 11/27 (2006.01); G06F 1/02 (2006.01); G06F 11/22 (2006.01)
CPC G06F 11/27 (2013.01) [G06F 1/022 (2013.01); G06F 11/2273 (2013.01)] 20 Claims
OG exemplary drawing
 
1. A test and measurement system, comprising:
a test and measurement instrument;
a test automation platform; and
one or more processors, the one or more processors configured to execute code that causes the one or more processors to:
receive a waveform created by operation of a device under test;
generate one or more tensor arrays;
apply machine learning to a first tensor array of the one or more tensor arrays to produce equalizer tap values;
apply machine learning to a second tensor array of the one of the one or more tensor arrays to produce predicted tuning parameters for the device under test;
use the equalizer tap values to produce a Transmitter and Dispersion Eye Closure Quaternary (TDECQ) value; and
provide the TDECQ value and the predicted tuning parameters to the test automation platform.