CPC G01N 23/18 (2013.01) [G01N 23/04 (2013.01); G01N 23/083 (2013.01); G01N 23/20008 (2013.01); G01N 23/2206 (2013.01); G01N 23/223 (2013.01); G21K 7/00 (2013.01); H01J 35/186 (2019.05); G01N 2223/04 (2013.01); G01N 2223/052 (2013.01); G01N 2223/071 (2013.01); G01N 2223/076 (2013.01); G01N 2223/1016 (2013.01); G01N 2223/20 (2013.01); G01N 2223/204 (2013.01); G01N 2223/32 (2013.01); G01N 2223/643 (2013.01); G01N 2223/652 (2013.01)] | 22 Claims |
1. An inspection apparatus for inspecting an inspection target object, comprising:
an X-ray generation tube having a target including an X-ray generation portion that generates X-rays by irradiation with an electron beam, and configured to emit X-rays to the inspection target object; and
a plurality of X-ray detectors,
wherein each of the plurality of X-ray detectors detects X-rays emitted from a foreign substance existing on an inspection target surface of the inspection target object irradiated with the X-rays from the X-ray generation portion and totally reflected by the inspection target surface,
wherein a distance between an inspection plane of the inspection target object and the X-ray generation portion is not larger than 5 mm.
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