US 12,261,608 B2
Control and calibration of external oscillators
Hyman Shanan, Piscataway, NJ (US); and John Kenney, West Windsor, NJ (US)
Assigned to Analog Devices, Inc., Wilmington, MA (US)
Appl. No. 18/247,691
Filed by Analog Devices, Inc., Wilmington, MA (US)
PCT Filed Dec. 7, 2021, PCT No. PCT/US2021/072775
§ 371(c)(1), (2) Date Apr. 3, 2023,
PCT Pub. No. WO2022/126097, PCT Pub. Date Jun. 16, 2022.
Claims priority of provisional application 63/122,575, filed on Dec. 8, 2020.
Prior Publication US 2023/0412175 A1, Dec. 21, 2023
Int. Cl. H03D 3/24 (2006.01); H03L 1/02 (2006.01); H03L 7/099 (2006.01); H03L 7/189 (2006.01); H04B 1/16 (2006.01)
CPC H03L 7/099 (2013.01) [H03L 1/02 (2013.01); H03L 7/189 (2013.01); H04B 1/16 (2013.01); H03L 2207/06 (2013.01)] 20 Claims
OG exemplary drawing
 
1. An electronic oscillator system comprising: a semiconductor die;
a controllable oscillator external to the semiconductor die and having an output configured to provide an output oscillator signal;
a first varactor configured to tune an oscillation frequency of the controllable oscillator; and
a second varactor configured to tune the oscillation frequency of the controllable oscillator,
wherein the semiconductor die comprises a phase-locked loop (PLL) configured to provide a fine tuning to the controllable oscillator by controlling a tuning voltage of the first varactor, and a calibration circuit configured to provide a coarse tuning to the controllable oscillator by controlling the second varactor, the calibration circuit configured to provide the coarse tuning based on the tuning voltage of the first varactor and the output oscillator signal.