US 12,261,606 B2
Measuring pin-to-pin delays between clock routes
Daniel Weyer, Austin, TX (US); and Raghunandan Kolar Ranganathan, Round Rock, TX (US)
Assigned to Skyworks Solutions, Inc., Irvine, CA (US)
Filed by Skyworks Solutions, Inc., Irvine, CA (US)
Filed on Jun. 20, 2023, as Appl. No. 18/212,088.
Application 18/212,088 is a continuation of application No. 17/697,052, filed on Mar. 17, 2022, granted, now 11,728,799.
Application 17/697,052 is a continuation of application No. 16/717,816, filed on Dec. 17, 2019, granted, now 11,283,437, issued on Mar. 22, 2022.
Prior Publication US 2024/0030904 A1, Jan. 25, 2024
Int. Cl. H03K 5/1534 (2006.01); G04F 10/00 (2006.01); H03K 5/00 (2006.01); H03L 7/08 (2006.01)
CPC H03K 5/1534 (2013.01) [G04F 10/005 (2013.01); H03K 2005/00019 (2013.01); H03L 7/08 (2013.01)] 20 Claims
OG exemplary drawing
 
1. A delay measurement circuit comprising:
a plurality of skew circuits;
a time measurement circuit configured to output a signal edge in a first mode; and
a plurality of pairs of matched conductive traces, each pair coupling a respective skew circuit of the plurality of skew circuits to the time measurement circuit, each respective skew circuit configured in the first mode to receive the signal edge on a first trace of its pair of matched conductive traces from the time measurement circuit and to directly return the signal edge to the time measurement circuit on a second trace of the pair irrespective of any signal received on a bonding pad coupled to the respective skew circuit, such that the first trace and the second trace form a loop between the time measurement circuit and the respective skew circuit in the first mode, and further configured in a second mode to pass a signal edge to the time measurement circuit on the second trace of the pair synchronous with a clock signal received on the bonding pad.