| CPC H01L 23/544 (2013.01) [B23K 26/352 (2015.10); H01L 21/4853 (2013.01); H01L 21/4857 (2013.01); H01L 21/565 (2013.01); H01L 21/568 (2013.01); H01L 23/3128 (2013.01); H01L 23/5383 (2013.01); H01L 23/5386 (2013.01); H01L 23/5389 (2013.01); H01L 23/562 (2013.01); H01L 24/19 (2013.01); H01L 24/20 (2013.01); B23K 2101/40 (2018.08); H01L 2223/54406 (2013.01); H01L 2224/214 (2013.01)] | 20 Claims |

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1. A semiconductor package, comprising:
an encapsulated semiconductor device comprising an encapsulating material and a semiconductor device encapsulated by the encapsulating material; and
a backside redistribution structure over a backside of the encapsulated semiconductor device and comprising a dummy pattern electrically insulated from the semiconductor device and a dielectric layer over the dummy pattern and comprising a marking pattern for revealing a part of the dummy pattern,
wherein the dummy pattern is overlapped with the semiconductor device from a top view of the semiconductor package.
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13. A semiconductor package, comprising:
an encapsulated semiconductor device comprising an encapsulating material and a semiconductor device encapsulated by the encapsulating material; and
a backside redistribution structure over a backside of the encapsulated semiconductor device and comprising:
a dummy pattern comprising a plurality of first dummy pads and a plurality of second dummy pads surrounding the first dummy pads, and a size of each of the first dummy pads is substantially greater than a size of each of the second dummy pads; and
a dielectric layer over the dummy pattern and comprising a marking pattern for revealing a part of the plurality of first dummy pads.
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18. A semiconductor package, comprising:
an encapsulated semiconductor device comprising an encapsulating material and a semiconductor device laterally encapsulated by the encapsulating material; and
a backside redistribution structure over a backside of the encapsulated semiconductor device and comprising:
a conductive layer comprising a circuit pattern electrically connected to the semiconductor device and a dummy pattern electrically insulated from the semiconductor device and the circuit pattern; and
a dielectric layer over the conductive layer and comprising a marking pattern for revealing a part of the dummy pattern and a bump receiving pattern for revealing a part of the circuit pattern; and
a plurality of conductive bumps disposed in the bump receiving pattern and electrically connected to the circuit pattern.
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