| CPC H01L 21/76831 (2013.01) [H01L 21/30608 (2013.01)] | 20 Claims |

|
1. A method of forming a structure, comprising:
forming an alternating stack of first material layers and second material layers over a substrate;
forming a mask layer over the alternating stack;
forming a cavity in the mask layer;
forming a first cladding liner on a sidewall of the cavity in the mask layer; and
forming a via opening in the alternating stack by performing an anisotropic etch process that transfers a pattern of the cavity in the mask layer through the alternating stack using a combination of the first cladding liner and the mask layer as an etch mask;
wherein:
the mask layer comprises a first patterning film having a concave upper surface; and
the first cladding liner comprises a cylindrical cladding film that is formed by conformally depositing a cladding material layer on physically exposed surfaces of the cavity and over a top surface of the first patterning film and removing horizontally-extending portions of the cladding material layer by anisotropically etching the cladding material layer.
|