US 12,261,034 B1
Ion analysis apparatus and method
Dimitris Papanastasiou, Faellanden (CH); Oliver Raether, Faellanden (CH); and Niels Goedecke, Faellanden (CH)
Assigned to BRUKER SWITZERLAND AG, Faellanden (CH)
Filed by BRUKER SWITZERLAND AG, Faellanden (CH)
Filed on Aug. 9, 2024, as Appl. No. 18/799,273.
Int. Cl. H01J 49/42 (2006.01); G01N 27/622 (2021.01); H01J 49/06 (2006.01)
CPC H01J 49/4215 (2013.01) [G01N 27/622 (2013.01); H01J 49/062 (2013.01); H01J 49/4225 (2013.01)] 20 Claims
OG exemplary drawing
 
1. An ion analysis apparatus, comprising:
an ionization source configured to generate a beam of ions;
a trapping device configured to receive the beam of ions and to axially transfer ions downstream;
a first quadrupole mass filter configured to receive the ions transferred from the trapping device and to transfer at least a first subset of the received ions;
a segmented linear quadrupole ion trap configured to receive the at least first subset of ions transferred from the first quadrupole mass filter, to perform a first processing step on the received at least first subset of ions and to transfer the processed ions;
a second quadrupole mass filter configured to receive the processed ions transferred from the segmented linear quadrupole ion trap and to transfer at least a second subset of the processed ions;
a collision cell configured to receive the at least second subset of ions transferred from the second quadrupole mass filter, to perform a second processing step on the received at least second subset of ions and to transfer the processed ions; and
a mass analyzer configured to receive the processed ions transferred from the collision cell and to mass analyze the received processed ions.