| CPC H01J 49/004 (2013.01) [H01J 49/025 (2013.01); H01J 49/067 (2013.01); H01J 49/16 (2013.01); H01J 49/20 (2013.01); H01J 49/24 (2013.01); H01J 49/0013 (2013.01); H01J 49/30 (2013.01)] | 15 Claims |

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1. A mass spectrometer assembly for performing tandem mass spectrometry, comprising:
an ionization component for producing sample ions from a sample;
an electrostatic analyzer for receiving the sample ions from the ionization component and producing a preferred set of sample ions;
a lens assembly for receiving the preferred set of sample ions from the electrostatic analyzer and focusing the preferred sample set of ions;
a magnet assembly for receiving the focused preferred sample set of ions at an entrance thereof and deflecting sample ions within the focused preferred sample set of ions using zero power to a first detector located in a same plane as the entrance to the magnet assembly for detecting the deflected sample ions, wherein individual sample ions are deflected to different points along the first detector in accordance with an individual mass thereof; and
an ion fragmentation component located in a region of the first detector, wherein the ion fragmentation component fragments one or more individual sample ions received at the first detector into fragments and the fragments are deflected to a second detector located in the plane of the first detector array.
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