US 12,260,547 B2
Machine vision-based automatic identification and rating method and system for low-magnification acid etching defect
Zhicheng Zhang, Huangshi (CN); Jin Ke, Huangshi (CN); Wei Fang, Huangshi (CN); Shaoyang Zhang, Huangshi (CN); and Changyuan Zhang, Huangshi (CN)
Assigned to DAYE SPECIAL STEEL CO. , LTD., Hubei (CN)
Appl. No. 18/260,408
Filed by DAYE SPECIAL STEEL CO., LTD., Huangshi (CN)
PCT Filed Dec. 29, 2021, PCT No. PCT/CN2021/142662
§ 371(c)(1), (2) Date Jul. 5, 2023,
PCT Pub. No. WO2022/117118, PCT Pub. Date Jun. 9, 2022.
Claims priority of application No. 202110013619.6 (CN), filed on Jan. 6, 2021.
Prior Publication US 2024/0233112 A1, Jul. 11, 2024
Int. Cl. G06T 7/00 (2017.01); C23F 1/00 (2006.01); G06F 18/00 (2023.01); G06F 18/2132 (2023.01); G06T 7/11 (2017.01); G06T 7/174 (2017.01); G06V 10/75 (2022.01)
CPC G06T 7/001 (2013.01) [G06F 18/2132 (2023.01); G06T 7/11 (2017.01); G06T 7/174 (2017.01); G06V 10/751 (2022.01); C23F 1/00 (2013.01); G06T 2207/30136 (2013.01)] 10 Claims
OG exemplary drawing
 
1. A machine vision-based automatic identification and rating method for low-magnification acid etching defect, used for automatically recognizing and ranking defects of a low-magnification acid-etched steel or steel billet or continuous casting billet sample after acid etching, comprising:
acquiring images of the low-magnification acid-etched sample according to a first pre-set condition to obtain a first image;
performing automatic image processing on the first image to obtain a second image;
performing image segmentation on the second image according to a second pre-set condition to obtain a third image, the image segmentation comprising taking the center of the second image as the center of a circle, performing concentric circle segmentation on the second image, and simultaneously performing quadrant segmentation on the second image according to a quadrant segmentation line of a pre-set quadrant to obtain the third image;
performing defect pattern recognition on the third image according to a pre-known defect type, and obtaining distribution data of defect patterns in the low-magnification acid-etched sample;
obtaining quantitative data of defect patterns in the low-magnification acid-etched sample according to the third image and the distribution data of defect patterns in the low-magnification acid-etched sample; and
ranking the defects in the low-magnification acid-etched sample according to the quantitative data of defect patterns in the low-magnification acid-etched sample.