US 12,260,537 B2
Defect detection method, computer device and storage medium
Wan-Jhen Lee, New Taipei (TW); Tung-Tso Tsai, New Taipei (TW); Chin-Pin Kuo, New Taipei (TW); Tzu-Chen Lin, New Taipei (TW); and Guo-Chin Sun, New Taipei (TW)
Assigned to HON HAI PRECISION INDUSTRY CO., LTD., New Taipei (TW)
Filed by HON HAI PRECISION INDUSTRY CO., LTD., New Taipei (TW)
Filed on Jul. 22, 2021, as Appl. No. 17/382,504.
Claims priority of application No. 202010712515.X (CN), filed on Jul. 22, 2020.
Prior Publication US 2022/0028055 A1, Jan. 27, 2022
Int. Cl. G06T 7/00 (2017.01); G06N 3/084 (2023.01)
CPC G06T 7/0004 (2013.01) [G06N 3/084 (2013.01); G06T 2207/20081 (2013.01); G06T 2207/20084 (2013.01)] 20 Claims
OG exemplary drawing
 
1. A product defect detection method applied to a computer device, the method comprising:
acquiring a detection image of a product;
dividing the detection image into a first preset number of detection blocks;
obtaining a detection result of each detection block by inputting each detection block into a preset defect recognition model that is corresponding to a position of each detection block in the detection image, wherein different positions corresponding to different preset defect recognition models; and
determining a detection result of the product according to the detection result of each detection block.