US 12,259,705 B2
Automatic assignment of device debug communication pins
Stephen Bowling, Chandler, AZ (US); Manivannan Balu, Karnataka (IN); Timothy Phoenix, Pepperell, MA (US); and Sankar Rangarajan, Chandler, AZ (US)
Assigned to Microchip Technology Incorporated, Chandler, AZ (US)
Filed by Microchip Technology Incorporated, Chandler, AZ (US)
Filed on Nov. 19, 2021, as Appl. No. 17/530,633.
Prior Publication US 2022/0187788 A1, Jun. 16, 2022
Int. Cl. G05B 19/406 (2006.01)
CPC G05B 19/406 (2013.01) [G05B 2219/33297 (2013.01)] 15 Claims
OG exemplary drawing
 
1. An apparatus, comprising:
a plurality of debug pins to communicatively couple the apparatus with a server;
a debugger circuit; and
a test controller circuit to:
in a programming mode, determine a subset of the plurality of debug pins used to program the apparatus with an operational functionality;
save a designation of the subset of the plurality of debug pins used to program the apparatus with the operational functionality;
in a test mode subsequent to the programming mode, use the designation to route the subset of the plurality of debug pins used to program the apparatus with the operational functionality to the debugger circuit for debug input and output with the server while debugging the operational functionality; and
save the designation of the subset of the plurality of debug pins used to program the apparatus upon a determination that the server has sent a signal to enter the test mode.