| CPC G03F 7/70408 (2013.01) [G03F 7/70633 (2013.01)] | 13 Claims |

|
1. A semiconductor device, comprising:
a first target positioned on a first layer and comprising a plurality of line features spaced equally apart from each other according to a first pitch; and
a second target positioned on a second layer and comprising a plurality of line features spaced equally apart from each other according to a second pitch;
wherein the first layer is different from the second layer;
wherein the first target and the second target do not overlap with each other;
wherein the first target is configured to generate an interference pattern when being illuminated by a lens comprising a grating configured thereon, wherein the grating superposes the first target to generate the interference pattern thereof;
wherein the second target is configured to generate an interference pattern when being illuminated by the lens comprising the grating configured thereon, wherein the grating superposes the second target to generate the interference pattern thereof;
wherein an overlay is determined by the interference pattern of the first target and the interference pattern of the second target without overlapping the first target and the second target with each other.
|