US 12,259,538 B2
Method for operating a sample chamber for microscopic imaging, apparatus, and sample chamber
Thomas Kalkbrenner, Jena (DE); and Ralf Wolleschensky, Jena (DE)
Assigned to CARL ZEISS MICROSCOPY GMBH, Jena (DE)
Appl. No. 17/309,793
Filed by CARL ZEISS MICROSCOPY GMBH, Jena (DE)
PCT Filed Dec. 2, 2019, PCT No. PCT/EP2019/083222
§ 371(c)(1), (2) Date Jun. 18, 2021,
PCT Pub. No. WO2020/126419, PCT Pub. Date Jun. 25, 2020.
Claims priority of application No. 10 2018 222 271.1 (DE), filed on Dec. 19, 2018.
Prior Publication US 2022/0043244 A1, Feb. 10, 2022
Int. Cl. G02B 21/34 (2006.01); G02B 21/00 (2006.01); G02B 21/06 (2006.01); G02B 21/26 (2006.01); G02B 21/36 (2006.01)
CPC G02B 21/0032 (2013.01) [G02B 21/002 (2013.01); G02B 21/0036 (2013.01); G02B 21/0076 (2013.01); G02B 21/06 (2013.01); G02B 21/26 (2013.01); G02B 21/34 (2013.01); G02B 21/365 (2013.01); G02B 21/367 (2013.01)] 9 Claims
OG exemplary drawing
 
1. A method for operating a sample chamber for microscopic imaging, the method comprising:
providing the sample chamber in an illumination beam path, wherein the sample chamber surrounds a sample space for positioning a sample and includes a wall that delimits the sample space and has an outer side facing away from the sample space, the outer side having a shape of a spherical segment with a circular disk as a base, and wherein the illumination beam path is directed through the outer side and into the sample space along an illumination axis;
capturing detection radiation, which was caused by illumination radiation directed into the sample space along the illumination axis, along a detection axis that extends from the sample space through the wall of the sample chamber;
rotating and/or pivoting the sample chamber relative to the detection axis about a center of the circular disk, so that different relative angular positions of the sample chamber and the detection axis are set; and
capturing image data at the different relative angular positions of the sample chamber and the detection axis.