US 12,259,453 B2
Systems and methods for vector-short-open-calibration de-embedding of microwave circuits
Jackson W. Massey, Austin, TX (US); Amir Hajiaboli, Austin, TX (US); and Vladimir I. Okhmatovski, Winnipeg (CA)
Assigned to Murata Manufacturing Co., Ltd., Nagaokakyo (JP)
Filed by Murata Manufacturing Co., Ltd., Nagaokakyo (JP)
Filed on Dec. 28, 2021, as Appl. No. 17/563,884.
Claims priority of provisional application 63/131,231, filed on Dec. 28, 2020.
Prior Publication US 2022/0206099 A1, Jun. 30, 2022
Int. Cl. G01R 35/00 (2006.01); G01R 27/28 (2006.01)
CPC G01R 35/005 (2013.01) [G01R 27/28 (2013.01)] 20 Claims
OG exemplary drawing
 
1. A method comprising:
measuring network parameters of a multilayered planar substrate including a microwave circuit and a feed line with a first port at a reference plane coupled to the microwave circuit and a second port coinciding with a boundary of the multilayered planar substrate;
measuring, with reference to the first port and the second port, an open-circuit current, a first short-circuit current, and a second short-circuit current;
obtaining network parameters of the feed line using a short-open-calibration (SOC) according to an ABCD-matrix, wherein an “a” block of the ABCD-matrix comprises a first matrix multiplied by a transpose of the first short-circuit current, wherein the first matrix is an inverse of a difference of the open-circuit current and the second short-circuit current, and wherein a “c” block of the ABCD-matrix comprises the open-circuit current multiplied by the “a” block;
de-embedding the network parameters of the feed line from the network parameters of the multilayered planar substrate to obtain microwave circuit network parameters;
comparing the microwave circuit network parameters to a specified range; and
responsive to the microwave circuit network parameters being within or not within the specified range, respectively approving or rejecting customer shipment of the microwave circuit.