| CPC G01R 31/2875 (2013.01) [G01R 31/2877 (2013.01)] | 22 Claims |

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1. A method for operating a single device under test (DUT), the method comprising:
controlling a first temperature of a first component of the single DUT by heating the first component to a first set point temperature, wherein the controlling the first temperature of the first component comprises applying a first force to the first component;
controlling a second temperature of a second component of the single DUT by heating the second component to a second set point temperature, wherein the controlling the second temperature of the second component comprises applying a second force to the second component, wherein the second force is different from the first force,
wherein the control of the first temperature of the first component is independent from the control of the second temperature of the second component,
wherein the single DUT is a single package.
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