US 12,259,407 B2
Contact probe for probe heads of electronic devices
Riccardo Vettori, Cernusco Lombardone (IT)
Assigned to TECHNOPROBE S.P.A., Cernusco Lombardone (IT)
Appl. No. 18/040,336
Filed by TECHNOPROBE S.P.A., Cernusco Lombardone (IT)
PCT Filed Aug. 3, 2021, PCT No. PCT/EP2021/071676
§ 371(c)(1), (2) Date Feb. 2, 2023,
PCT Pub. No. WO2022/029126, PCT Pub. Date Feb. 10, 2022.
Claims priority of application No. 102020000019126 (IT), filed on Aug. 4, 2020.
Prior Publication US 2023/0314476 A1, Oct. 5, 2023
Int. Cl. G01R 1/067 (2006.01); G01R 1/073 (2006.01)
CPC G01R 1/06738 (2013.01) [G01R 1/06716 (2013.01); G01R 1/07357 (2013.01)] 25 Claims
OG exemplary drawing
 
1. A contact probe comprising:
a first end portion adapted to abut onto a contact pad of a device under test;
a second end portion adapted to abut onto a contact pad of a PCB board of a testing apparatus,
a probe body extended between the first end portion and the second end portion along a longitudinal development direction and provided with at least one opening extending along the longitudinal development direction and
at least one pair of arms being defined in the probe body by the at least one opening,
wherein each of the arms of the at least one pair of arms has a transversal section, perpendicular to the longitudinal development direction, and the transversal section has an area that constantly changes along the longitudinal development direction of the probe body.