US 12,259,340 B2
Nondestructive inspecting device, and nondestructive inspecting method
Kunihiro Fujita, Wako (JP); Chihiro Iwamoto, Wako (JP); Takaoki Takanashi, Wako (JP); and Yoshie Otake, Wako (JP)
Assigned to RIKEN, Wako (JP)
Appl. No. 18/031,745
Filed by RIKEN, Wako (JP)
PCT Filed Oct. 15, 2021, PCT No. PCT/JP2021/038273
§ 371(c)(1), (2) Date Apr. 13, 2023,
PCT Pub. No. WO2022/085591, PCT Pub. Date Apr. 28, 2022.
Claims priority of application No. 2020-175252 (JP), filed on Oct. 19, 2020.
Prior Publication US 2023/0393082 A1, Dec. 7, 2023
Int. Cl. G01N 23/204 (2006.01); G01N 23/20008 (2018.01)
CPC G01N 23/20008 (2013.01) [G01N 2223/316 (2013.01)] 11 Claims
OG exemplary drawing
 
1. A non-destructive inspecting device comprising:
a neutron emission device that emits a neutron beam to a local irradiation location on a surface of an inspection target;
a detection device that detects, at each of inspection positions facing the surface, scattered neutrons returned from the inspection target as a result of emission of the neutron beam to the irradiation location, and measures a detected number of the scattered neutrons at each of the detection positions;
a ratio calculation unit that calculates, for each of the detection positions, a ratio of the detected number at the detection position to a reference value for the detection position;
a data processing unit that identifies an increase peak formation portion and a decrease peak formation portion of the ratio, and determines magnitude Sp of the increase peak formation portion and magnitude Sn of the decrease peak formation portion; and
a determination unit that determines a defect in the inspection target, based on Sp and Sn.