US 12,257,324 B2
Semiconductor SWCNT slurry for bioimaging and method for inspecting the same
Tsukasa Takeuchi, Kyoto (JP); Toshiya Okazaki, Ibaraki (JP); Yoko Iizumi, Ibaraki (JP); Hiromichi Kataura, Ibaraki (JP); and Masako Yudasaka, Ibaraki (JP)
Assigned to SHIMADZU CORPORATION, Kyoto (JP); and NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY, Tokyo (JP)
Appl. No. 16/764,590
Filed by SHIMADZU CORPORATION, Kyoto (JP); and NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY, Tokyo (JP)
PCT Filed Nov. 17, 2017, PCT No. PCT/JP2017/041565
§ 371(c)(1), (2) Date May 15, 2020,
PCT Pub. No. WO2019/097698, PCT Pub. Date May 23, 2019.
Prior Publication US 2020/0384127 A1, Dec. 10, 2020
Int. Cl. B32B 9/00 (2006.01); A61K 49/00 (2006.01); C01B 32/159 (2017.01); C01B 32/174 (2017.01); B82Y 5/00 (2011.01); B82Y 20/00 (2011.01); B82Y 40/00 (2011.01)
CPC A61K 49/0065 (2013.01) [A61K 49/0019 (2013.01); A61K 49/0076 (2013.01); C01B 32/159 (2017.08); C01B 32/174 (2017.08); B82Y 5/00 (2013.01); B82Y 20/00 (2013.01); B82Y 40/00 (2013.01); C01B 2202/02 (2013.01); C01B 2202/22 (2013.01); C01P 2004/64 (2013.01); Y10T 428/30 (2015.01)] 2 Claims
OG exemplary drawing
 
1. A method for inspecting a semiconductor single-walled carbon nanotube (SWCNT) slurry for bioimaging, the slurry comprising: semiconductor SWCNTs oxidized by being directly irradiated with ultraviolet rays in atmosphere and a dispersant composed of an amphiphilic substance that coats surfaces of the SWCNTs, the method comprising:
using at least two of absorption spectroscopy, a photoluminescence method, and particle size measurement, to confirm that an average particle size of the semiconductor SWCNTs is smaller than 10 nm, and the semiconductor SWCNTs are oxidized.