US 12,257,084 B2
Motion free CT sampling with electron beam scanning and time delay integration detector
Tiezhi Zhang, St. Louis, MO (US); Qinghao Chen, St. Louis, MO (US); Shuang Zhou, St. Louis, MO (US); and Yuewen Tan, St. Louis, MO (US)
Assigned to Washington University, St. Louis, MO (US)
Filed by Washington University, St. Louis, MO (US)
Filed on Nov. 8, 2022, as Appl. No. 18/053,551.
Claims priority of provisional application 63/276,827, filed on Nov. 8, 2021.
Prior Publication US 2023/0141925 A1, May 11, 2023
Int. Cl. A61B 6/02 (2006.01); A61B 6/00 (2006.01); A61B 6/03 (2006.01); A61B 6/40 (2024.01); A61B 6/42 (2024.01)
CPC A61B 6/032 (2013.01) [A61B 6/027 (2013.01); A61B 6/4021 (2013.01); A61B 6/4028 (2013.01); A61B 6/4085 (2013.01); A61B 6/4233 (2013.01); A61B 6/4435 (2013.01)] 5 Claims
OG exemplary drawing
 
1. A method for performing computed tomography (CT)
producing x-ray photons with an x-ray source;
moving focal spots in a same speed and an opposite direction of a gantry rotation;
performing projection measurement with a 2D detector while the focal spots move in a same speed and an opposite direction of the gantry rotation; and
shifting data in the same speed and the opposite direction of the gantry rotation using a time-delay-integration detector,
wherein the x-ray source and the 2D detector are mounted on the gantry, and moving the focal spots comprises moving a focal spot of the focal spots in a saddle trajectory and moving the focal spot in the same speed and opposite direction of the gantry rotation during each sampling or projection measurement.