US 11,936,374 B1
Driver with built-in self testing of switch status
Jeffrey A. Dykstra, Chicago, IL (US); Jaroslaw Adamski, Chicago, IL (US); Smita Kanikaraj, San Diego, CA (US); and Douglas Lacy, San Diego, CA (US)
Assigned to PSEMI CORPORATION, San Diego, CA (US)
Filed by pSemi Corporation, San Diego, CA (US)
Filed on Sep. 23, 2022, as Appl. No. 17/934,787.
Int. Cl. H03K 17/56 (2006.01)
CPC H03K 17/56 (2013.01) 20 Claims
OG exemplary drawing
 
1. A switch circuit arrangement, comprising:
a control circuit;
a plurality of measurement circuits coupled to the control circuit, each measurement circuit comprising a current source; and
a corresponding plurality of switches respectively coupled to measurement circuits of the plurality of measurement circuits,
wherein the control circuit comprises a read mode of operation that is configured, selected switch by selected switch, to:
i) activate the current source to inject current through the selected switch, and
ii) based on the current injected through the selected switch, read, through the measurement circuit, a resulting voltage to measure a programming status of the selected switch;
wherein the read mode of operation is a sequential read mode of operation; and
wherein the plurality of switches are arranged to include through switches and shunt switches, wherein
each through switch has a first through switch terminal coupled to a respective measurement circuit and a second through switch terminal, the first through switch terminal and the second through switch terminal configured to be selectively coupled to an RF signal, and
each shunt switch has a first shunt switch terminal coupled to a respective measurement circuit and configured to be selectively coupled to the RF signal and a second shunt switch terminal coupled to a reference voltage or ground.