	US 11,935,615 B2
	Thermometer sample and hold design for non-volatile memory
Xiaojiang Guo, San Jose, CA (US); and Weihua Shi, Shanghai (CN)
Assigned to Intel Corporation, Santa Clara, CA (US)
Appl. No. 17/441,236
Filed by Intel Corporation, Santa Clara, CA (US)
PCT Filed May 27, 2019, PCT No. PCT/CN2019/088530 § 371(c)(1), (2) Date Sep. 20, 2021, PCT Pub. No. WO2020/237456, PCT Pub. Date Dec. 3, 2020.
Prior Publication US 2022/0157350 A1, May 19, 2022
Int. Cl. G11C 7/00 (2006.01); G01K 7/20 (2006.01); G01K 13/00 (2021.01); G11C 7/04 (2006.01); G11C 7/10 (2006.01)

CPC G11C 7/04 (2013.01) [G01K 7/20 (2013.01); G01K 13/00 (2013.01); G11C 7/1063 (2013.01)]

20 Claims

1. A non-volatile memory device comprising:

a non-volatile memory array;

a thermal sensor to detect a temperature of the non-volatile memory device; and

circuitry to:

sample the temperature of the non-volatile memory device at regular intervals,

store the sampled temperature, and

output the stored temperature in response to receipt of a command;

wherein the circuitry to sample the temperature includes:

an oscillator to generate a clock signal, wherein the regular intervals at which the temperature is to be sampled are based on the clock signal, and

a frequency divider to receive the clock signal and output a signal to turn on thermometer circuitry.