CPC G01R 31/31721 (2013.01) [G01R 31/31705 (2013.01); G01R 31/318314 (2013.01); G01R 31/318533 (2013.01)] | 24 Claims |
1. An integrated circuit, comprising:
a plurality of circuit blocks; and
a control circuit coupled to the plurality of circuit blocks, the control circuit to:
identify a probe type of a probe that connects the integrated circuit to a debug test system;
identify a debug use case to be used by the debug test system; and
turn off or disable at least one of a clock or a power to one or more circuit blocks of the plurality of circuit blocks which are not associated with the probe type and the debug use case.
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