| CPC H10K 71/00 (2023.02) [B41J 2/01 (2013.01); B41J 2/0456 (2013.01); B41J 2/04581 (2013.01); B41J 2/04586 (2013.01); B41J 2/04588 (2013.01); B41J 2/04593 (2013.01); B41J 2/2054 (2013.01); H10K 71/135 (2023.02); H10K 71/191 (2023.02); H10K 71/811 (2023.02)] | 20 Claims | 

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               1. A method of processing a substrate, comprising: 
            for each nozzle of a printhead for ejecting a liquid onto the substrate, receiving data representing an expected droplet volume produced by the nozzle in association with one or more waveforms; 
                receiving data representing a desired volume of the liquid to be deposited in each of a plurality of locations of the substrate; 
                for each location, obtaining a tolerance range for aggregate volume deposited in the location, the tolerance range surrounding the desired volume for the location; 
                for each location, selecting a plurality of combinations of nozzles and waveforms that can be used to deposit droplets of the liquid in the location such that the expected droplet volumes of each selected combination of nozzles and waveforms sum to a value within the tolerance range for the location; 
                from the selected combinations, identifying a combination of nozzles and waveforms that maximizes a number of locations receiving the liquid in one scan of the printhead; 
                depositing droplets at the locations using the corresponding identified nozzle and waveform combination for each location to form a liquid layer; and 
                processing the liquid layer to form a solid layer on the substrate. 
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