US 12,256,250 B2
Electronic device for transmitting test signal and operation method thereof
Chanho Choi, Suwon-si (KR); Seijoon Shim, Suwon-si (KR); and Kwangjin Ahn, Suwon-si (KR)
Assigned to Samsung Electronics Co., Ltd., Suwon-si (KR)
Filed by Samsung Electronics Co., Ltd., Suwon-si (KR)
Filed on Aug. 9, 2022, as Appl. No. 17/884,110.
Application 17/884,110 is a continuation of application No. PCT/KR2021/009066, filed on Jul. 14, 2021.
Claims priority of application No. 10-2020-0086926 (KR), filed on Jul. 14, 2020.
Prior Publication US 2022/0394524 A1, Dec. 8, 2022
Int. Cl. H04W 24/08 (2009.01); H04L 5/00 (2006.01); H04W 16/14 (2009.01); H04W 72/0453 (2023.01); H04W 72/23 (2023.01)
CPC H04W 24/08 (2013.01) [H04L 5/0048 (2013.01); H04W 16/14 (2013.01); H04W 72/0453 (2013.01); H04W 72/23 (2023.01)] 20 Claims
OG exemplary drawing
 
1. An electronic device comprising:
a communication circuit; and
a processor,
wherein the processor is configured to:
generate configuration information for transmitting a designated test signal in a second transmission band of a new radio (NR) cell, the second transmission band at least partially overlapping a first transmission band of a long-term evolution (LTE) cell, and
transmit the designated test signal based on the configuration information in the second transmission band of the NR cell through the communication circuit,
wherein the designated test signal is transmitted in first resource elements among resource elements included in a resource block of the second transmission band of the NR cell,
wherein the resource block of the second transmission band of the NR cell overlaps resource blocks of the first transmission band, and
wherein second resource elements other than the first resource elements among the resource elements included in the resource block are occupied by a designated signal for LTE.