US 12,255,649 B2
Temperature-controlled driver with built-in self testing of switch status
Jeffrey A. Dykstra, Chicago, IL (US); and Rodd E. Novak, San Diego, CA (US)
Assigned to Murata Manufacturing Co., Ltd., Nagaokakyo (JP)
Filed by Murata Manufacturing Co., Ltd., Nagaokakyo (JP)
Filed on Jul. 11, 2023, as Appl. No. 18/350,325.
Application 18/350,325 is a continuation in part of application No. 17/934,787, filed on Sep. 23, 2022, granted, now 11,936,374.
Prior Publication US 2024/0106420 A1, Mar. 28, 2024
Int. Cl. H03K 3/017 (2006.01)
CPC H03K 3/017 (2013.01) 21 Claims
OG exemplary drawing
 
1. A switch circuit arrangement comprising:
a control circuit;
a switch;
a driver circuit coupled to the control circuit and the switch,
wherein:
a) the control circuit further comprises a program mode of operation that is configured to:
i) generate a first control pulse, provided to the driver circuit to program the switch to an ON state; and
ii) generate a second control pulse, provided to the driver circuit to program the switch to an OFF state;
b) the driver circuit is configured to generate a first driving pulse in correspondence with the first control pulse;
c) the driver circuit is configured to generate a second driving pulse in correspondence with the second control pulse, and
d) a width and an amplitude of each of the first and the second driving pulses are each a function of a temperature of the switch.