| CPC H01L 25/18 (2013.01) [H01L 21/563 (2013.01); H01L 21/565 (2013.01); H01L 23/3128 (2013.01); H01L 23/34 (2013.01); H01L 23/5226 (2013.01); H01L 23/5283 (2013.01); H01L 24/09 (2013.01); H01L 24/17 (2013.01); H01L 24/33 (2013.01); H01L 24/49 (2013.01); H01L 24/73 (2013.01); H01L 2224/023 (2013.01); H01L 2224/0231 (2013.01); H01L 2224/02373 (2013.01); H01L 2224/02381 (2013.01); H01L 2224/0401 (2013.01); H01L 2224/73203 (2013.01); H01L 2224/73257 (2013.01); H01L 2224/73265 (2013.01); H01L 2225/1041 (2013.01)] | 20 Claims |

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1. A semiconductor package, comprising:
a bottom package having a redistribution structure and a semiconductor die electrically connected to the redistribution structure;
a top package disposed on the redistribution structure of the bottom package, wherein the redistribution structure is disposed between the top package and the semiconductor die of the bottom package, and the top package is spaced apart from the semiconductor die of the bottom package by the redistribution structure;
an underfill disposed between the top package and the bottom package; and
a heat dissipating structure disposed over the bottom package,
wherein the heat dissipating structure includes a thermal relaxation block disposed beside the top package, the redistribution structure includes a ground plane, and the thermal relaxation block is electrically connected to the ground plane of the redistribution structure.
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