| CPC H01L 23/5226 (2013.01) [H01L 23/53209 (2013.01); H01L 23/53276 (2013.01); H01L 23/5329 (2013.01)] | 20 Claims | 

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               1. A semiconductor structure, comprising: 
            a substrate; and 
                a via structure through the substrate, the via structure comprising: 
                a first conductive portion, the first conductive portion having a ring-shaped cross section; 
                a second conductive portion disposed at an inner side of the first conductive portion, the second conductive portion having a ring-shaped cross section; 
                a first barrier portion disposed at an outer side of the first conductive portion; 
                a second barrier portion disposed between the first conductive portion and the second conductive portion; and 
                a third barrier portion disposed at an inner side of the second conductive portion; 
                wherein at least one of the first barrier portion, the second barrier portion, or the third barrier portion comprises an insulating 2D material. 
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