US 12,254,917 B2
Power supply circuit, memory, testing device, memory system, and electronic device
Yu Wang, Hubei (CN); and BiRuo Song, Hubei (CN)
Assigned to Yangtze Memory Technologies Co., Ltd., Wuhan (CN)
Filed by Yangtze Memory Technologies Co., Ltd., Hubei (CN)
Filed on Dec. 28, 2022, as Appl. No. 18/090,065.
Claims priority of application No. 202211449376.1 (CN), filed on Nov. 18, 2022.
Prior Publication US 2024/0170041 A1, May 23, 2024
Int. Cl. G11C 11/4074 (2006.01); G11C 11/4076 (2006.01); G11C 29/50 (2006.01); H02M 3/155 (2006.01)
CPC G11C 11/4074 (2013.01) [G11C 11/4076 (2013.01); G11C 29/50004 (2013.01); H02M 3/155 (2013.01); G11C 2029/5004 (2013.01)] 20 Claims
OG exemplary drawing
 
1. A power supply circuit, comprising a voltage adjusting circuit and an oscillation circuit, wherein a first voltage output terminal of the voltage adjusting circuit is coupled with a power supply input terminal of a delay chain circuit in a memory, and the first voltage output terminal of the voltage adjusting circuit is coupled with a power supply input terminal of the oscillation circuit, wherein
the voltage adjusting circuit is configured to output a first voltage to the delay chain circuit and the oscillation circuit via the first voltage output terminal,
the oscillation circuit is configured to generate a clock signal corresponding to the first voltage,
the voltage adjusting circuit is further configured to receive an adjusting signal for adjusting the first voltage, and
the adjusting signal is determined based on a frequency of the clock signal.