US 12,254,654 B2
Microstructural image analysis device and microstructural image analysis method
Takayuki Kanda, Tokyo (JP)
Assigned to HITACHI, LTD., Tokyo (JP)
Filed by Hitachi, Ltd., Tokyo (JP)
Filed on Jan. 13, 2022, as Appl. No. 17/574,635.
Claims priority of application No. 2021-022455 (JP), filed on Feb. 16, 2021.
Prior Publication US 2022/0262040 A1, Aug. 18, 2022
Int. Cl. G06T 3/40 (2024.01); G06T 7/00 (2017.01); G06T 7/11 (2017.01); G06T 7/136 (2017.01); G06T 11/20 (2006.01)
CPC G06T 7/97 (2017.01) [G06T 3/40 (2013.01); G06T 7/11 (2017.01); G06T 7/136 (2017.01); G06T 11/206 (2013.01); G06T 2207/10056 (2013.01)] 8 Claims
OG exemplary drawing
 
1. A microstructural image analysis device for analyzing a microstructural image, the device comprising:
a processor and a memory that stores instructions that when executed by the processor configure the processor to:
extract a first region and a second region from the microstructural image;
expand the first region and the second region in an expansion processing by converting values of one or more pixels around the first region and the second region to different values;
extract an overlapping region of both the first region and the second region each time the first region and the second region are expanded; and
generate a persistence diagram, which is a two-dimensional coordinate system, based on a hole region generated and eliminated due to the overlapping region increasing each time the first region and the second region are expanded, the coordinate system having a horizontal axis indicating a number of repetitions of the expansion processing when a hole region is generated, and a vertical axis indicating a number of repetitions of the expansion processing when the hole region is eliminated.