US 12,254,254 B2
Circuits and techniques for predicting failure of circuits based on stress origination metrics and stress victim events
Veit Kleeberger, Munich (DE); Rafael Zalman, Markt Schwaben (DE); Georg Georgakos, Erding (DE); Dirk Hammerschmidt, Villach (AT); Bernhard Gstoettenbauer, Engerwitzdorf (AT); Ludwig Rossmeier, Dorfen (DE); and Thomas Zettler, Hoehenkirchen-Siegertsbrunn (DE)
Assigned to Infineon Technologies AG, Neubiberg (DE)
Filed by Infineon Technologies AG, Neubiberg (DE)
Filed on Dec. 1, 2021, as Appl. No. 17/457,216.
Prior Publication US 2023/0169250 A1, Jun. 1, 2023
Int. Cl. G06F 30/3308 (2020.01); G01R 31/26 (2020.01); G01R 31/27 (2006.01); G06F 11/00 (2006.01); G06F 30/33 (2020.01); G06F 30/333 (2020.01); G06F 30/367 (2020.01); G06F 119/02 (2020.01); G06F 119/18 (2020.01)
CPC G06F 30/3308 (2020.01) [G01R 31/2642 (2013.01); G01R 31/27 (2013.01); G06F 11/008 (2013.01); G06F 30/33 (2020.01); G06F 30/333 (2020.01); G06F 30/367 (2020.01); G06F 2119/02 (2020.01); G06F 2119/18 (2020.01)] 22 Claims
OG exemplary drawing
 
1. A circuit comprising:
a function unit configured to perform a circuit function;
a memory configured to store stress data associated with use of the circuit, wherein the stress data includes one or more stress origination metrics measured during use of the circuit, one or more stress victim events identified during use of the circuit, and one or more initial state conditions associated with manufacturing the circuit; and
a failure prediction unit configured to estimate a probability of failure of the circuit based on the one or more stress origination metrics, the one or more stress victim events, and the one or more initial state conditions.